Observatorio de I+D+i UPM

Memorias de investigación
Communications at congresses:
XPS as characterization tool for PV: from the substrate to complete III-V multijunction solar cells
Year:2011
Research Areas
  • Electronic technology and of the communications
Information
Abstract
This contribution aims to illustrate the potential of the Xray photoelectron spectroscopy (XPS) technique as a tool to analyze different parts of a solar cell (surface state, heterointerfaces, profile composition of ohmic contacts, etc). Here, the analysis is specifically applied to III-V multijunction solar cells used in concentrator systems. The information provided from such XPS analysis has helped to understand the physico-chemical nature of these surfaces and interfaces, and thus has guided the technological process in order to improve the solar cell performance.
International
Si
Congress
37th IEEE Photovoltaic Specialists Conference
960
Place
Seattle (USA)
Reviewers
Si
ISBN/ISSN
978-1-4244-9965-6
Start Date
19/06/2011
End Date
24/06/2011
From page
229
To page
233
37th IEEE Photovoltaic Specialists Conference
Participants
  • Autor: M. Gabás
  • Autor: M.C. López-Escalante
  • Autor: Carlos Algora Del Valle (UPM)
  • Autor: Ignacio Rey-Stolle Prado (UPM)
  • Autor: Enrique Barrigon Montañes (UPM)
  • Autor: Ivan Garcia Vara (UPM)
  • Autor: Beatriz Galiana Blanco (UPM)
  • Autor: S. Palanco
  • Autor: S. Bijani
  • Autor: J.R. Ramos-Barrado
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: Semiconductores III-V
  • Centro o Instituto I+D+i: Instituto de Energía Solar
  • Departamento: Electrónica Física
S2i 2020 Observatorio de investigación @ UPM con la colaboración del Consejo Social UPM
Cofinanciación del MINECO en el marco del Programa INNCIDE 2011 (OTR-2011-0236)
Cofinanciación del MINECO en el marco del Programa INNPACTO (IPT-020000-2010-22)