Descripción
|
|
---|---|
This contribution aims to illustrate the potential of the Xray photoelectron spectroscopy (XPS) technique as a tool to analyze different parts of a solar cell (surface state, heterointerfaces, profile composition of ohmic contacts, etc). Here, the analysis is specifically applied to III-V multijunction solar cells used in concentrator systems. The information provided from such XPS analysis has helped to understand the physico-chemical nature of these surfaces and interfaces, and thus has guided the technological process in order to improve the solar cell performance. | |
Internacional
|
Si |
Nombre congreso
|
37th IEEE Photovoltaic Specialists Conference |
Tipo de participación
|
960 |
Lugar del congreso
|
Seattle (USA) |
Revisores
|
Si |
ISBN o ISSN
|
978-1-4244-9965-6 |
DOI
|
|
Fecha inicio congreso
|
19/06/2011 |
Fecha fin congreso
|
24/06/2011 |
Desde la página
|
229 |
Hasta la página
|
233 |
Título de las actas
|
37th IEEE Photovoltaic Specialists Conference |