Memorias de investigación
Ponencias en congresos:
Statistical calculation of the main reliability functions for concentrator III-V solar cells
Año:2011
Áreas de investigación
  • Tecnología electrónica y de las comunicaciones
Datos
Descripción
This paper presents some of the results of a method to determine the main reliability functions of concentrator solar cells. High concentrator GaAs single junction solar cells have been tested in an Accelerated Life Test. The method can be directly applied to multi-junction solar cells. The main conclusions of this test carried out show that these solar cells are robust devices with a very low probability of failure caused by degradation during their operation life (more than 30 years). The evaluation of the probability operation function (i.e. the reliability function R(t)) is obtained for two nominal operation conditions of these cells, namely simulated concentration ratios of 700 and 1050 suns. Preliminary determination of the Mean Time to Failure indicates a value much higher than the intended operation life time of the concentrator cells.
Internacional
Si
Nombre congreso
37th IEEE Photovoltaic Specialists Conference
Tipo de participación
960
Lugar del congreso
Seattle (USA)
Revisores
Si
ISBN o ISSN
978-1-4244-9965-6
DOI
Fecha inicio congreso
19/06/2011
Fecha fin congreso
24/06/2011
Desde la página
2533
Hasta la página
2536
Título de las actas
37th IEEE Photovoltaic Specialists Conference
Esta actividad pertenece a memorias de investigación
Participantes
Grupos de investigación, Departamentos, Centros e Institutos de I+D+i relacionados
  • Creador: Grupo de Investigación: Semiconductores III-V
  • Centro o Instituto I+D+i: Instituto de Energía Solar
  • Departamento: Electrónica Física