Observatorio de I+D+i UPM

Memorias de investigación
Research Publications in journals:
UV laser-induced high resolution cleaving of Si wafers for micro-nano devices and polymeric waveguide characterization
Year:2011
Research Areas
Information
Abstract
International
Si
JCR
Si
Title
APPLIED SURFACE SCIENCE
ISBN
0169-4332
Impact factor JCR
1,793
Impact info
Volume
257
10.1016/j.apsusc.2010.11.021
Journal number
12
From page
5424
To page
5428
Month
Ranking
40/116 PHYSICS, APPLIED (SCI); 26/67 PHYSICS, CONDENSED MATTER (SCI); 7/18 MATERIALS SCIENCE, COATINGS AND FILMS (SCI); 75/125 CHEMISTRY, PHYSICAL (SCI)
Participants
  • Autor: r. casquel (UPM)
  • Autor: m. holgado (UPM)
  • Autor: j. j. garcia-ballesteros (UPM)
  • Autor: k. zinoviev
  • Autor: c. fernandez-sanchez
  • Autor: f. j. sanza (UPM)
  • Autor: c. molpeceres (UPM)
  • Autor: m. f. laguna (UPM)
  • Autor: a. llobera
  • Autor: j. l. ocana (UPM)
  • Autor: c. dominguez
Research Group, Departaments and Institutes related
  • Creador: No seleccionado
  • Centro o Instituto I+D+i: Centro Laser
S2i 2019 Observatorio de investigación @ UPM con la colaboración del Consejo Social UPM
Cofinanciación del MINECO en el marco del Programa INNCIDE 2011 (OTR-2011-0236)
Cofinanciación del MINECO en el marco del Programa INNPACTO (IPT-020000-2010-22)