Observatorio de I+D+i UPM

Memorias de investigación
Communications at congresses:
Did you validate your ontology? OOPS!
Year:2012
Research Areas
  • Information technology and adata processing
Information
Abstract
The application of methodologies for building ontologies can improve ontology quality. However, such quality is not guaranteed because of the difficulties involved in ontology modelling. These difficulties are related to the inclusion of anomalies or bad practices within the ontology development. Sev-eral authors have provided lists of typical anomalies detected in ontologies dur-ing the last decade. In this context, our aim in this paper is to describe OOPS! (OntOlogy Pitfall Scanner!), a tool for detecting pitfalls in ontologies.
International
Si
Congress
Demos and Poster Session at 9th Extended Semantic Web Conference (ESWC2012)
960
Place
Heraklion, Grecia
Reviewers
Si
ISBN/ISSN
978-3-642-30284-8
Start Date
29/05/2012
End Date
29/05/2012
From page
0
To page
0
The Semantic Web: Research and Applications - 9th Extended Semantic Web Conference, ESWC 2012. Volume : 7295
Participants
  • Autor: Maria Poveda Villalon (UPM)
  • Autor: M. Carmen Suarez de Figueroa Baonza (UPM)
  • Autor: Asuncion de Maria Gomez Perez (UPM)
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: Ontology Engineering Group
  • Departamento: Inteligencia Artificial
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