Observatorio de I+D+i UPM

Memorias de investigación
Research Publications in journals:
Electronic structure of copper nitrides as a function of nitrogen content
Year:2013
Research Areas
  • Engineering
Information
Abstract
The nitrogen content dependence of the electronic properties for copper nitride thin films with an atomic percentage of nitrogen ranging from 26±2 to 33±2 have been studied by means of optical (spectroscopic ellipsometry), thermoelectric (Seebeck), and electrical resistivity measurements. The optical spectra are consistent with direct optical transitions corresponding to the stoichiometric semiconductor Cu3N plus a free-carrier contribution, essentially independent of temperature, which can be tuned in accordance with the N-excess. Deviation of the N content from stoichiometry drives to significant decreases from ?5 to?50 ?V/K in the Seebeck coefficient and to large enhancements, from 10?3 up to 10 ? cm, in the electrical resistivity. Band structure and density of states calculations have been carried out on the basis of the density functional theory to account for the experimental results.
International
Si
JCR
Si
Title
THIN SOLID FILMS
ISBN
0040-6090
Impact factor JCR
1,89
Impact info
Volume
531
10.1016/j.tsf.2013.01.030
Journal number
From page
588
To page
591
Month
SIN MES
Ranking
0
Participants
  • Autor: Nuria Gordillo Garcia (UPM)
  • Autor: Raquel Gonzalez Arrabal (UPM)
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: Fusión Nuclear Inercial y Tecnología de fusión
  • Centro o Instituto I+D+i: Instituto de Fusión Nuclear
  • Departamento: Ingeniería Nuclear
S2i 2020 Observatorio de investigación @ UPM con la colaboración del Consejo Social UPM
Cofinanciación del MINECO en el marco del Programa INNCIDE 2011 (OTR-2011-0236)
Cofinanciación del MINECO en el marco del Programa INNPACTO (IPT-020000-2010-22)