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Descripción
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| This work presents a physics-based numerical electro-thermal model for Schottky diodes capable of evaluating the thermal effects on the electrical performance of devices and circuits. This model is able to calculate internal temperature distributions and identify regions where heat is generated, providing useful information for device design and circuit reliability. | |
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Internacional
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Si |
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Nombre congreso
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38th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) |
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Tipo de participación
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960 |
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Lugar del congreso
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Mainz on the Rhine, Germany |
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Revisores
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Si |
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ISBN o ISSN
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978-14-6734-717-4 |
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DOI
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10.1109/IRMMW-THz-2013.6665467 |
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Fecha inicio congreso
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01/09/2013 |
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Fecha fin congreso
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06/09/2013 |
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Desde la página
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Hasta la página
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2 |
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Título de las actas
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Proceedings |