|
Descripción
|
|
|---|---|
| A temperature accelerated life test on commercial concentrator lattice-matched GaInP/GaInAs/Ge triple-junction solar cells has been carried out. The solar cells have been tested at three different temperatures: 119, 126 and 164 degrees C and the nominal photo-current condition (820 X) has been emulated by injecting current in darkness. All the solar cells have presented catastrophic failures. The failure distributions at the three tested temperatures have been fitted to an Arrhenius-Weibull model. An Arrhenius activation energy of 1.58 eV was determined from the fit. The main reliability functions and parameters (reliability function, instantaneous failure rate, mean time to failure, warranty time) of these solar cells at the nominal working temperature (80 degrees C) have been obtained. The warranty time obtained for a failure population of 5 % has been 69 years. Thus, a long-term warranty could be offered for these particular solar cells working at 820 X, 8 hours per day at 80 degrees C. | |
|
Internacional
|
Si |
|
Nombre congreso
|
9th International Conference on Concentrator Photovoltaic Systems (CPV-9) |
|
Tipo de participación
|
960 |
|
Lugar del congreso
|
Miyazaki, Japan |
|
Revisores
|
Si |
|
ISBN o ISSN
|
0094-243X |
|
DOI
|
10.1063/1.4822236 |
|
Fecha inicio congreso
|
15/04/2013 |
|
Fecha fin congreso
|
17/04/2013 |
|
Desde la página
|
222 |
|
Hasta la página
|
225 |
|
Título de las actas
|
Evaluation of the reliability of commercial concentrator triple-junction solar cells by means of Accelerated Life Tests (ALT) |