Observatorio de I+D+i UPM

Memorias de investigación
Communications at congresses:
On-site tests for the detection of potential induced degradation in modules
Year:2013
Research Areas
  • Electronic technology and of the communications
Information
Abstract
This paper presents different test alternatives which can be used on-site in a PV installation to detect potential induced degradation (PID) in modules. The testing procedures proposed are: thermal imaging; electroluminescence imaging; open circuit voltage measurements; operating voltage measurements; IV curve measurements; and dark IV curve measurements. Advantages and disadvantages of each test are reported.
International
Si
Congress
28th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) de París
960
Place
París (Francia)
Reviewers
Si
ISBN/ISSN
2196-100X
Start Date
30/09/2013
End Date
04/10/2013
From page
1
To page
5
Proceedings 28th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) de París
Participants
  • Autor: Francisco Martinez Moreno (UPM)
  • Autor: Antonio-P.Eduardo Lorenzo Pigueiras (UPM)
  • Autor: R. Parra
  • Autor: T. Espino
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: SISTEMAS FOTOVOLTÁICOS
  • Centro o Instituto I+D+i: Instituto de Energía Solar
  • Departamento: Electrónica Física
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