Abstract
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This paper presents different test alternatives which can be used on-site in a PV installation to detect potential induced degradation (PID) in modules. The testing procedures proposed are: thermal imaging; electroluminescence imaging; open circuit voltage measurements; operating voltage measurements; IV curve measurements; and dark IV curve measurements. Advantages and disadvantages of each test are reported. | |
International
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Si |
Congress
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28th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) de París |
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960 |
Place
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París (Francia) |
Reviewers
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Si |
ISBN/ISSN
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2196-100X |
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Start Date
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30/09/2013 |
End Date
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04/10/2013 |
From page
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1 |
To page
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5 |
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Proceedings 28th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) de París |