Memorias de investigación
Ponencias en congresos:
Case study in failure analysis of ALT on commercial triple junction concentrator solar cells
Año:2013
Áreas de investigación
  • Tecnología electrónica y de las comunicaciones
Datos
Descripción
In this work the failure analysis carried out in III-V concentrator multijunction solar cells after a temperature accelerated life test is presented. All the failures appeared have been catastrophic since all the solar cells turned into low shunt resistances. A case study in failure analysis based on characterization by optical microscope, SEM, EDX, EQE and XPS is presented in this paper, revealing metal deterioration in the bus bar and fingers as well as cracks in the semiconductor structure beneath or next to the bus bar. In fact, in regions far from the bus bar the semiconductor structure seems not to be damaged. SEM images have dismissed the presence of metal spikes inside the solar cell structure. Therefore, we think that for these particular solar cells, failures appear mainly as a consequence of a deficient electrolytic growth of the front metallization which also results in failures in the semiconductor structure close to the bus bars.
Internacional
Si
Nombre congreso
39th IEEE Photovoltaic Specialists Conference (PVSC)
Tipo de participación
960
Lugar del congreso
Tampa, Florida
Revisores
Si
ISBN o ISSN
9781479933006
DOI
10.1109/PVSC.2013.6744465
Fecha inicio congreso
16/06/2013
Fecha fin congreso
21/06/2013
Desde la página
1666
Hasta la página
1671
Título de las actas
Case study in failure analysis of ALT on commercial triple junction concentrator solar cells
Esta actividad pertenece a memorias de investigación
Participantes
Grupos de investigación, Departamentos, Centros e Institutos de I+D+i relacionados
  • Creador: Centro o Instituto I+D+i: Instituto de Energía Solar
  • Departamento: Electrónica Física