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Descripción
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| This paper presents different test alternatives which can be used on-site in a PV installation to detect potential induced degradation (PID) in modules. The testing procedures proposed are: thermal imaging; electroluminescence imaging; open circuit voltage measurements; operating voltage measurements; IV curve measurements; and dark IV curve measurements. Advantages and disadvantages of each test are reported. | |
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Internacional
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Si |
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Nombre congreso
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28th European Photovoltaic Solar Energy Conference and Exhibition |
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Tipo de participación
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960 |
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Lugar del congreso
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París |
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Revisores
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Si |
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ISBN o ISSN
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3-936338-33-7 |
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DOI
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10.4229/28thEUPVSEC2013-4AV.5.43 |
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Fecha inicio congreso
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30/09/2013 |
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Fecha fin congreso
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04/10/2013 |
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Desde la página
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3313 |
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Hasta la página
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3317 |
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Título de las actas
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Proceedings of the 28th EU PVSEC 2013 (Paris) |