Observatorio de I+D+i UPM

Memorias de investigación
Research Publications in journals:
Uncertainty in ellipse fitting using a flatbed scanner: development and experimental verification
Year:2013
Research Areas
  • Engineering
Information
Abstract
In the field of dimensional metrolgy, the use of opticasl measuring machines requieres the handling of a large number of measurement points, or scanning points, taken from the image of the measurend
International
Si
JCR
Si
Title
Measurement Science & Technology
ISBN
0957-0233
Impact factor JCR
1,435
Impact info
Volume
Journal number
25
From page
1
To page
10
Month
NOVIEMBRE
Ranking
Participants
  • Autor: Jesus de Vicente Y Oliva (UPM)
  • Autor: Angel M. Sanchez Perez (UPM)
  • Autor: M. Berzal
  • Autor: P. Manresca
  • Autor: E. Gómez
Research Group, Departaments and Institutes related
  • Creador: Departamento: Física Aplicada a la Ingeniería Industrial
S2i 2019 Observatorio de investigación @ UPM con la colaboración del Consejo Social UPM
Cofinanciación del MINECO en el marco del Programa INNCIDE 2011 (OTR-2011-0236)
Cofinanciación del MINECO en el marco del Programa INNPACTO (IPT-020000-2010-22)