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Descripción
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| A temperature accelerated life test on concentrator lattice mismatched Ga0.37In0.63P/Ga0.83In0.17As/Ge triple-junction solar cells-on-carrier is being carried out. The solar cells have been tested at three different temperatures: 125, 145 and 165°C and the nominal photo-current condition (500X) is emulated by injecting current in darkness. The final objective of these tests is to evaluate the reliability, warranty period, and failure mechanism of these solar cells in a moderate period of time. Up to now only the test at 165°C has finished. Therefore, we cannot provide complete reliability information, but we have carried out preliminary data and failure analysis with the current results. | |
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Internacional
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Si |
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Nombre congreso
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10th International Conference on Concentrator Photovoltaic Systems - CPV-10 |
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Tipo de participación
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960 |
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Lugar del congreso
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Albuquerque, NM (EEUU) |
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Revisores
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Si |
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ISBN o ISSN
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978-0-7354-1253-8 |
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DOI
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10.1063/1.4897072 |
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Fecha inicio congreso
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07/04/2014 |
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Fecha fin congreso
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09/04/2014 |
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Desde la página
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250 |
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Hasta la página
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253 |
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Título de las actas
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AIP Conference Proceedings 1616 |