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Descripción
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| I worked with Dr. Fred Lee, and my topic was analytical model for Panasonic GaN HEMT. For this time period, I developed around 70% of the model and performed some Double Pulse Test measurements on the real device, in order to obtain important turn-on and turn-off signals that can be compared to the modeled ones. Good agreement was obtained, especially for the turn-on switching transition | |
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Internacional
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Si |
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Lugar
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CPES (Virginia, USA) |
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Tipo
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Fecha inicio
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01/07/2014 |
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Fecha fin
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20/09/2014 |