Memorias de investigación
Artículos en revistas:
Determination of a refractive index and an extinction coefficient of standard production of CVD-graphene
Año:2015
Áreas de investigación
  • Dispositivos electrónicos,
  • Células solares
Datos
Descripción
The refractive index and extinction coefficient of chemical vapour deposition grown graphene are determined by ellipsometry analysis. Graphene films were grown on copper substrates and transferred as both monolayers and bilayers onto SiO2/Si substrates by using standard manufacturing procedures. The chemical nature and thickness of residual debris formed after the transfer process were elucidated using photoelectron spectroscopy. The real layered structure so deduced has been used instead of the nominal one as the input in the ellipsometry analysis of monolayer and bilayer graphene, transferred onto both native and thermal silicon oxide. The effect of these contamination layers on the optical properties of the stacked structure is noticeable both in the visible and the ultraviolet spectral regions, thus masking the graphene optical response. Finally, the use of heat treatment under a nitrogen atmosphere of the graphene-based stacked structures, as a method to reduce the water content of the sample, and its effect on the optical response of both graphene and the residual debris layer are presented. The Lorentz-Drude model proposed for the optical response of graphene fits fairly well the experimental ellipsometric data for all the analysed graphene-based stacked structures.
Internacional
Si
JCR del ISI
Si
Título de la revista
Nanoscale
ISSN
2040-3364
Factor de impacto JCR
7,394
Información de impacto
Volumen
7
DOI
10.1039/c4nr06119e
Número de revista
4
Desde la página
1491
Hasta la página
1500
Mes
SIN MES
Ranking
Q1
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Participantes
Grupos de investigación, Departamentos, Centros e Institutos de I+D+i relacionados
  • Creador: Grupo de Investigación: Semiconductores III-V
  • Centro o Instituto I+D+i: Instituto de Energía Solar
  • Departamento: Electrónica Física