Research Publications in journals:
Amorphous/crystalline silicon interface characterization by capacitance and conductance measurements
Amorphous/crystalline silicon interface characterization by capacitance and conductance measurements
Year:2015
Research Areas
Information
|
Abstract
|
|
|---|---|
| 0 | |
|
International
|
Si |
|
JCR
|
Si |
|
Title
|
PROCEEDINGS OF THE 2015 10TH SPANISH CONFERENCE ON ELECTRON DEVICES (CDE) |
|
ISBN
|
2163-4971 |
|
Impact factor JCR
|
0 |
|
Impact info
|
|
|
Volume
|
|
|
|
|
|
Journal number
|
|
|
From page
|
37 |
|
To page
|
+ |
|
Month
|
|
|
Ranking
|
0 |
Participants
- Autor: r. garcia-hernansanz (UPM)
- Autor: d. montero-alvarez
- Autor: a. del prado (UPM)
- Autor: g. gonzalez-diaz (UPM)
- Autor: j. olea
Research Group, Departaments and Institutes related
- Creador: No seleccionado
- Departamento: Ingeniería y Gestión Forestal y Ambiental
S2i 2020 Observatorio de investigación @ UPM con la colaboración del Consejo Social UPM
Cofinanciación del MINECO en el marco del Programa INNPACTO (IPT-020000-2010-22)