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Descripción
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| Super-resolution (SR) software-based techniques aim at generating a final image by combining several noisy frames with lower resolution from the same scene. A comparative study on high-resolution high-angle annular dark field images of InAs/GaAs QDs has been carried out in order to evaluate the performance of the SR technique. The obtained SR images present enhanced resolution and higher signal-to-noise (SNR) ratio and sharpness regarding the experimental images. In addition, SR is also applied in the field of strain analysis using digital image processing applications such as geometrical phase analysis and peak pairs analysis. The precision of the strain mappings can be improved when SR methodologies are applied to experimental images. | |
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Internacional
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Si |
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JCR del ISI
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Si |
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Título de la revista
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Journal of Microscopy |
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ISSN
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0022-2720 |
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Factor de impacto JCR
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2,136 |
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Información de impacto
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Datos JCR del año 2015 |
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Volumen
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262 |
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DOI
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10.1111/jmi.12341 |
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Número de revista
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1 |
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Desde la página
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50 |
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Hasta la página
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58 |
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Mes
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SIN MES |
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Ranking
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