Observatorio de I+D+i UPM

Memorias de investigación
Research Publications in journals:
Strain mapping accuracy improve-ment using Super-Resolution techniques
Year:2016
Research Areas
  • Electronic technology and of the communications
Information
Abstract
Super-resolution (SR) software-based techniques aim at generating a final image by combining several noisy frames with lower resolution from the same scene. A comparative study on high-resolution high-angle annular dark field images of InAs/GaAs QDs has been carried out in order to evaluate the performance of the SR technique. The obtained SR images present enhanced resolution and higher signal-to-noise (SNR) ratio and sharpness regarding the experimental images. In addition, SR is also applied in the field of strain analysis using digital image processing applications such as geometrical phase analysis and peak pairs analysis. The precision of the strain mappings can be improved when SR methodologies are applied to experimental images.
International
Si
JCR
Si
Title
Journal of Microscopy
ISBN
0022-2720
Impact factor JCR
2,136
Impact info
Datos JCR del año 2015
Volume
262
10.1111/jmi.12341
Journal number
1
From page
50
To page
58
Month
SIN MES
Ranking
Participants
  • Autor: C. Bárcena-González (UCA)
  • Autor: M.P. Guerrero-Lebrero (UCA)
  • Autor: E. Guerrero
  • Autor: D. Fernández-Reyes (UCA)
  • Autor: D. González
  • Autor: A. Mayoral
  • Autor: Antonio David Utrilla Lomas (UPM)
  • Autor: Jose Maria Ulloa Herrero (UPM)
  • Autor: P.L. Galindo (UCA)
Research Group, Departaments and Institutes related
  • Creador: Departamento: Ciencia de Materiales
  • Departamento: Ingeniería Electrónica
S2i 2020 Observatorio de investigación @ UPM con la colaboración del Consejo Social UPM
Cofinanciación del MINECO en el marco del Programa INNCIDE 2011 (OTR-2011-0236)
Cofinanciación del MINECO en el marco del Programa INNPACTO (IPT-020000-2010-22)