Observatorio de I+D+i UPM

Memorias de investigación
Thesis:
Potential induced degradationon c-Si photovoltaic modules and installations
Year:2017
Research Areas
  • Photovoltaic generation
Information
Abstract
This work presents approaches to assess the PotentiaL Induced Degradation (PID) on c-Si photovoltaic modules and installations. The IEC TS 62804-1:2015 was applied to the laboratory tests and some additional actions are suggested. The adaptation of the technical specification aims to monitor the degradation rates during the tests and also to consider the capacity of the photovoltaic modules to recover from athe degradation. In the field detection methodologies are presented and anti-PID circuits were also tested. The theoretical approach reveals that individual voltage measurements are useful to detect PID even in its early stage, as can be seen on the case studies presented.
International
Si
Type
Doctoral
Mark Rating
Sobresaliente
Date
14/11/2017
Participants
  • Director: Roberto Zilles (Universidade de Sao Paulo)
  • Director: Antonio-P.Eduardo Lorenzo Pigueiras (UPM)
  • Autor: Gilberto Figueiredo Pinto Filho
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: Sistemas Fotovoltaicos
  • Departamento: Electrónica Física, Ingeniería Eléctrica y Física Aplicada
  • Centro o Instituto I+D+i: Instituto de Energía Solar
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