|
Descripción
|
|
|---|---|
| Electronic components in spaceships are subjected to vibration loads during the ascent phase of the launcher. It is important to verify by tests and analysis that all parts can survive in the most severe load cases. The purpose of this paper is to present the methodology and results of the application of the Steinberg?s fatigue mode l to estimate the life of electronic components of the EPT -HET instrument for the Solar Orbiter space mission. A Nastran finite element model (FEM) of the EPT -HET instrument was created and used for the structural analysis. The methodology is based on the use of the FEM of the entire instrument to calculate the relative displacement RDSD and RMS values of the PCBs from random vibration analysis. These values are used to estimate the fatigue life of the most susceptible electronic components with the Steinbe rg?s fatigue damage equation and the Miner?s cumulative fatigue index. The estimations are calculated for two different configurations of the instrument and three different inputs in order to support the redesign process. Finally, these analytical results are contrasted with the inspections and the functional tests made after the vibration tests, concluding that this methodology can adequately predict the fatigue damage or survival of the electronic components. | |
|
Internacional
|
Si |
|
JCR del ISI
|
No |
|
Título de la revista
|
aip Conference Proceedings - 22nd International Conference on Computer Methods in Mechanics CMM2017 |
|
ISSN
|
15517616 |
|
Factor de impacto JCR
|
|
|
Información de impacto
|
|
|
Volumen
|
|
|
DOI
|
10.1063/1.5019088 |
|
Número de revista
|
|
|
Desde la página
|
100003-1 |
|
Hasta la página
|
100003-11 |
|
Mes
|
SIN MES |
|
Ranking
|
|