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Descripción
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| The cost reduction of the solar cells devices becomes fundamental in the current situation of the photovoltaic industry. A new device based on very thin upgraded metallurgical silicon (UMG-Si) is being analyzed. The success of these cells requires a good behavior of the silicon substrates from a mechanical point of view. It?s well known that the UMG-Si presents higher number of impurities compared with solar grade silicon. Once the cracks originated by the wafering process are removed by chemical baths, these impurities are the origin of the wafer failure. This paper analyzes the strength of these substrates in comparison with the solar grade silicon substrates in order to establish if it?s necessary to handle or not with special care these new substrates | |
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Internacional
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Si |
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Nombre congreso
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33rd European Photovoltaic Solar Energy Conference and Exhibition |
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Tipo de participación
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960 |
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Lugar del congreso
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Amsterdam |
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Revisores
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Si |
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ISBN o ISSN
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3-936338-47-7 |
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DOI
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Fecha inicio congreso
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25/09/2017 |
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Fecha fin congreso
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29/09/2017 |
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Desde la página
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523 |
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Hasta la página
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526 |
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Título de las actas
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Proceedings of the 33rd European Photovoltaic Solar Energy Conference and Exhibition |