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Descripción
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| The present invention is an interferometric detection method which allows improving the limit of detection and taking interferometric measurements with a much higher degree of sensitivity than that allowed by interferometric devices known in the state of the art. The invention is characterized by the use of two interferometric measurements, a first reference measurement in a wavelength range and a second measurement on the observation region in at least the same wavelength range in which it is to be determined whether or not there are changes, where a quotient function, which is the function to be analyzed for establishing parameters determining the change experienced in the observation region with a high degree of sensitivity, is constructed from said measurements. | |
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Internacional
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Si |
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Estado
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Solicitada |
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Referencia Patente Prioritaria
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EP20120382317 20120803 ; WO2013EP66298 20130802 |
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En explotación
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Si |
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Licenciatarios
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Fecha solicitud
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03/08/2012 |
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Titulares aparte de la UPM
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