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Descripción
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| The first contribution of this paper consists on a live catalogue of pitfalls that extends previous works on modeling errors with pitfalls resulting from an empirical analysis of numerous ontologies. Such a catalogue classifies pitfalls according to the Structural, Functional and Usability-Profiling dimensions. For each pitfall, we include the value of its importance level (critical, important and minor). The second contribution is the description of OntOlogy Pitfall Scanner (OOPS!), a widely used tool for detecting pitfalls in ontologies and targeted at newcomers and domain experts unfamiliar with description logics and ontology implementation languages. The tool operates independently of any ontology development platform and is available through a web application and a web service. The evaluation of the system is provided both through a survey of users' satisfaction and worldwide usage statistics. In addition, the system is also compared with existing ontology evaluation tools in terms of coverage of pitfalls detecte | |
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Internacional
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Si |
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DOI
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Edición del Libro
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Editorial del Libro
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IGI Global |
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ISBN
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9781522550426 |
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Serie
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Título del Libro
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Innovations, Developments, and Applications of Semantic Web and Information Systems |
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Desde página
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120 |
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Hasta página
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148 |