Observatorio de I+D+i UPM

Memorias de investigación
Book chapters:
OOPS!: A Pitfall-Based System for Ontology Diagnosis
Year:2018
Research Areas
  • Information technology and adata processing
Information
Abstract
The first contribution of this paper consists on a live catalogue of pitfalls that extends previous works on modeling errors with pitfalls resulting from an empirical analysis of numerous ontologies. Such a catalogue classifies pitfalls according to the Structural, Functional and Usability-Profiling dimensions. For each pitfall, we include the value of its importance level (critical, important and minor). The second contribution is the description of OntOlogy Pitfall Scanner (OOPS!), a widely used tool for detecting pitfalls in ontologies and targeted at newcomers and domain experts unfamiliar with description logics and ontology implementation languages. The tool operates independently of any ontology development platform and is available through a web application and a web service. The evaluation of the system is provided both through a survey of users' satisfaction and worldwide usage statistics. In addition, the system is also compared with existing ontology evaluation tools in terms of coverage of pitfalls detecte
International
Si
Book Edition
Book Publishing
IGI Global
ISBN
9781522550426
Series
Book title
Innovations, Developments, and Applications of Semantic Web and Information Systems
From page
120
To page
148
Participants
  • Autor: Maria Poveda Villalon (UPM)
  • Autor: Asuncion de Maria Gomez Perez (UPM)
  • Autor: M. Carmen Suarez de Figueroa Baonza (UPM)
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: Ontology Engineering Group
  • Departamento: Inteligencia Artificial
S2i 2020 Observatorio de investigación @ UPM con la colaboración del Consejo Social UPM
Cofinanciación del MINECO en el marco del Programa INNCIDE 2011 (OTR-2011-0236)
Cofinanciación del MINECO en el marco del Programa INNPACTO (IPT-020000-2010-22)