Memorias de investigación
Ponencias en congresos:
Semiconductor parameter extraction via current-voltage characterization and Bauesian inference methods
Año:2018
Áreas de investigación
  • Ingenierías
Datos
Descripción
Defects in semiconductors, although atomistic in scale and often scarce in concentration, frequently represent the performance-limiting factor in optoelectronic devices such as solar cells. However, due to this scale and scarcity, direct experimental characterization of defects is technically challenging, timeconsuming, and expensive. Even so, the fact that defects can limit device performance suggests that device-level characterization should be able to lend insight into their properties. In this work, we use Bayesian inference to demonstrate a way to relate experimental device measurements with defect properties (as well as other materials properties affected by the presence of defects, such as minority-carrier lifetime).
Internacional
Si
Nombre congreso
IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC)
Tipo de participación
960
Lugar del congreso
Waikoloa (USA)
Revisores
Si
ISBN o ISSN
978-1-5386-8530-3
DOI
Fecha inicio congreso
10/06/2018
Fecha fin congreso
15/06/2018
Desde la página
3271
Hasta la página
3275
Título de las actas
Proceedings of IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC)
Esta actividad pertenece a memorias de investigación
Participantes
  • Autor: R.C. Kurchin
  • Autor: J.R. Poindexter
  • Autor: D. Kitchaev
  • Autor: V. Vahanissi
  • Autor: Carlos del Cañizo Nadal UPM
  • Autor: L. Zhe
  • Autor: H.S. Laine
  • Autor: C. Roat
  • Autor: S. Levcenco
  • Autor: G. Ceder
  • Autor: T. Buonassisi
Grupos de investigación, Departamentos, Centros e Institutos de I+D+i relacionados
  • Creador: Centro o Instituto I+D+i: Instituto de Energía Solar
  • Departamento: Electrónica Física