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Memorias de investigación
Communications at congresses:
The electrical origin of the 1/f electrical noise in solid-state devices and integrated circuits
Year:2007
Research Areas
  • Electronics engineering
Information
Abstract
Contrarily to current theories based on hypothetical traps where charge carriers can translocate to, this paper gives an explanation for 1/f electrical noise in solid-state devices based on well known electrical effects taking place in these devices. A parasitic capacitor and the backgating effect of its thermal noise, both overlooked in the course of the years, are the basis of the above explanation. The above effect produces a resistance noise with a Lorentzian spectrum in any unbiased resistor. As soon as the resistor is biased, this spectrum is scattered into a continuous set of Lorentzian noise terms that synthesize 1/f noise over a frequency band that is an exponential function of the bias voltage V-DS expressed in thermal units V-T. This is due to the exponential dependence of the dynamical resistance in most semiconductor junctions. A V-DS= 180MV is thus enough to give 1/f noise over three decades at room temperature. This unexpected and non-linear feature, where the spectrum of this noise results from the own bias used to measure it, has kept IN noise as a puzzling and enigmatic noise for more than eighty years. The above theory, born in the solid-state field, can also be generalized to other devices where two orthogonal forces or energy gradients appear while electrical noise is being measured.
International
Si
Congress
Conference on VLSI Circuits and Systems III
960
Place
Maspalomas. ESPAÑA
Reviewers
Si
ISBN/ISSN
Start Date
02/05/2007
End Date
04/05/2007
From page
To page
Participants
  • Autor: Jose Ignacio Izpura Torres (UPM)
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: Microsistemas y materiales electrónicos
  • Departamento: Ingeniería Electrónica
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