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Memorias de investigación
Research Publications in journals:
CEST and MEST tools for the simulation of radio frequency electric dicharges in waveguides
Year:2008
Research Areas
  • Electronic
Information
Abstract
In this paper we present two software tools for the simulation of electron multiplication processes in radio frequency (RF) waveguides. The electric discharges are caused by the multiplication of a small initial number of electrons. These are accelerated by the RF ¯eld and produce new electrons either by collisions with the walls of the waveguide (ripping new electrons from them), or by ionization of the neutral atoms of a gas inside the device. MEST allows simulating the Multipactor e®ect, a discharge produced in vacuum and generated by the collision of the electrons with the walls. CEST simulates the discharge when in addition a neutral gas is present in the waveguide, at pressures lower than ground levels (often denominated Corona discharge). The main characteristic of both tools is that they implement individual-based, microscopic models, where every electron is individually represented and tracked. In the case of MEST, the simulation is discrete- event, as the trajectory of each electron can be computed analytically. In CEST we use a hybrid simulation approach. The trajectory of each electron is governed by the Langevin stochastic di®erential equations that take into account a deterministic RF electric force and the random interaction with the neutral atom background. In addition, wall and ionizing collisions are modelled as discrete events. The tools allow performing batches of simulations with di®erent wall coating materials and gasses, and have produced results in good agreement with experimental and theo- retical data. The di®erent output forms generated at run-time have proven to be very useful in order to analyze the di®erent discharge processes. The tools are valuable for the selection of the most promising coating materials for the construction of the waveguide, as well as for the identification of safe operating parameters
International
Si
JCR
Si
Title
SIMULATION MODELLING PRACTICE AND THEORY
ISBN
1569-190X
Impact factor JCR
0,375
Impact info
Volume
78
10.1016.j.simpat.2008.08.002
Journal number
0
From page
026407-1
To page
6
Month
AGOSTO
Ranking
Participants
  • Participante: D. RABOSO
  • Participante: M. ALFONSECA
  • Participante: J. DE LARA
  • Autor: Luis Conde Lopez (UPM)
  • Participante: F. PÉREZ
  • Participante: L. GALÁN
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: Grupo de Investigación en Fusión Inercial y Física de Plasmas
  • Departamento: Física Aplicada a la Ingeniería Aeronáutica
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