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Descripción
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| Many surface processes, i.e. infiltration, depressional storage, gas exchange, are affected by soil surface microrelief. Conversely, many surface processes, i.e. erosion, deposition also cause changes in soil surface roughness. Therefore, quantification of surface roughness can enhance the understanding of these physical processes. Recent research has shown the usefulness of multifractal analysis in soil surface roughness characterization. Here we analyze, first, to what extent the multifractal spectra of soil surface microrelief are affected by resolution of devices used to measure it and, second the influence of the algorithm used for multifractal analysis. | |
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Internacional
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Si |
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Nombre congreso
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EGU General Assembly 2008 |
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Tipo de participación
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960 |
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Lugar del congreso
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Viena, Austria |
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Revisores
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Si |
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ISBN o ISSN
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1029-7006 |
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DOI
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Fecha inicio congreso
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13/04/2008 |
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Fecha fin congreso
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18/04/2008 |
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Desde la página
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1 |
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Hasta la página
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1 |
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Título de las actas
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Geophysical Research Abstracts, Vol. 10, SRef-ID: 1607-7962/gra/EGU2008-A-09491 |