Observatorio de I+D+i UPM

Memorias de investigación
Communications at congresses:
Matching Points in Poor Edge Information Images
Year:2009
Research Areas
  • Processing and signal analysis
Information
Abstract
Pattern matching and image patches correspondence have been described in several papers. However, in most cases the results are obtained using images with high level of detail, in other words, images with useful edge information. This paper describes a method to find correspondences between images with very poor edge information -for instance a painting with a cloudless sky- and its application to reflectographic images mosaicing. Unlike other pattern matching techniques, the proposed method solves the issue of low levels of detail or lack of good information, both needed for the determination of the correspondences used by common likeness measure (cross-norm correlation), features correspondence (Harris, SUSAN) and object recognition methods. Thus, intensity-augmented ordinal measure method is used: a window-based noise-robust method to calculate matching points. This method is improved with our Point Structure Selection (PSS) procedure to select good correspondences and reject false positives.
International
Si
Congress
ICIP 2009 IEEE International Conference on Image Processing
960
Place
El Cairo
Reviewers
Si
ISBN/ISSN
978-1-4244-5653-6
10.1109/ICIP.2009.5414221
Start Date
07/10/2009
End Date
10/10/2009
From page
197
To page
200
Matching Points in Poor Edge Information Images
Participants
  • Autor: Alberto Posse Fernández (UPM)
  • Autor: Juan Torres Arjona (UPM)
  • Autor: Jose Manuel Menendez Garcia (UPM)
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: Grupo de Aplicación de Telecomunicaciones Visuales (G@TV)
  • Departamento: Señales, Sistemas y Radiocomunicaciones
S2i 2020 Observatorio de investigación @ UPM con la colaboración del Consejo Social UPM
Cofinanciación del MINECO en el marco del Programa INNCIDE 2011 (OTR-2011-0236)
Cofinanciación del MINECO en el marco del Programa INNPACTO (IPT-020000-2010-22)