Observatorio de I+D+i UPM

Memorias de investigación
Communications at congresses:
Characterization of concentrator optical surfaces based on CCD camera measurement
Year:2009
Research Areas
  • Electric engineering
Information
Abstract
Roughness, dust and another surfaces imperfections cause light scattering at the optical collector on a CPV system. Consequently, part of the scattered rays in concentrator systems should be definitively lost because they cannot be focused onto the receivers. For this reason, it is important to characterize optical elements involved in CPV systems in order to achieve higher efficiency. A method based on CCD camera for measuring light scattering and absorption is presented in order to acquire enough information about optical performance of CPV optic materials. By means of CCD images, we are able to characterize the light profile before and after going through the optical material. Several features as light sources, mirror and glasses surfaces and angle acceptance functions can be evaluated in order to achieve a good CPV performance.
International
Si
Congress
24th European Photovoltaic Solar Energy Conference and Exhibition
960
Place
Hamburgo, Alemania
Reviewers
Si
ISBN/ISSN
3-936338-25-6
Start Date
21/09/2009
End Date
25/09/2009
From page
827
To page
830
Proceedings of the 24th European Photovoltaic Solar Energy Conference and Exhibition
Participants
  • Autor: Rebeca Herrero Martin (UPM)
  • Autor: Gabriel Sala Pano (UPM)
  • Autor: Ignacio Anton Hernandez (UPM)
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: Integración de Sistemas e Instrumentos (ISI)
  • Centro o Instituto I+D+i: Instituto de Energía Solar
  • Departamento: Sistemas Electrónicos y de Control
  • Departamento: Electrónica Física
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