Observatorio de I+D+i UPM

Memorias de investigación
Research Publications in journals:
On the electrical origin of flicker noise in vacuum devices
Year:2009
Research Areas
  • Electronics engineering
Information
Abstract
We have recently shown that thermal noise in the space-charge regions of solid-state devices can account for most of their excess noise, whose 1/f spectrum is produced by the dc bias that was used to convert resistance noise into a voltage noise to be measured. This spectrum reflects the modulation of an energy barrier that confines carriers along the channel of such devices ¿a feature that was also found for electrons around cathodes of vacuum tubes. Using this novel theory, we can predict a flicker noise in vacuum tubes¿a noise whose origin has eluded scientists since its early report by Johnson in 1925.
International
Si
JCR
Si
Title
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
ISBN
0018-9456
Impact factor JCR
0,978
Impact info
Volume
58
Journal number
10
From page
3592
To page
3601
Month
ENERO
Ranking
Participants
  • Autor: Jose Ignacio Izpura Torres (UPM)
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: Microsistemas y Materiales Electrónicos
  • Departamento: Ingeniería Electrónica
S2i 2019 Observatorio de investigación @ UPM con la colaboración del Consejo Social UPM
Cofinanciación del MINECO en el marco del Programa INNCIDE 2011 (OTR-2011-0236)
Cofinanciación del MINECO en el marco del Programa INNPACTO (IPT-020000-2010-22)