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Memorias de investigación
Communications at congresses:
A Double Classification of Common Pitfalls in Ontologies
Year:2010
Research Areas
  • Artificial intelligence
Information
Abstract
The application of methodologies for building ontologies has improved the ontology quality. However, such a quality is not totally guaranteed because of the difficulties involved in ontology modelling. These difficulties are related to the inclusion of anomalies or worst practices in the modelling. In this context, our aim in this paper is twofold: (1) to provide a catalogue of common worst practices, which we call pitfalls, and (2) to present a double classification of such pitfalls. These two products will serve in the ontology development in two ways: (a) to avoid the appearance of pitfalls in the ontology modelling, and (b) to evaluate and correct ontologies to improve their quality.
International
Si
Congress
Workshop on Ontology Quality (OntoQual 2010), Co-located with EKAW 2010
960
Place
Lisbon,Portugal
Reviewers
Si
ISBN/ISSN
1613-0073
Start Date
15/10/2010
End Date
15/10/2010
From page
1
To page
12
Proceedings of Workshop on Ontology Quality (OntoQual 2010), Co-located with EKAW 2010
Participants
  • Autor: Maria Poveda Villalon (UPM)
  • Autor: M. Carmen Suarez de Figueroa Baonza (UPM)
  • Autor: Asuncion de Maria Gomez Perez (UPM)
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: Ontology Engineering Group (LIA). Laboratorio Inteligencia Artificial. Grupo de Ingeniería Ontológica
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