Memorias de investigación
Artículos en revistas:
Novel accelerated testing method for III-V concentrator solar cells
Año:2010
Áreas de investigación
  • Tecnología electrónica y de las comunicaciones
Datos
Descripción
Accelerated testing is a necessary tool in order to demonstrate the reliability of concentration photovoltaic solar cells, devices which is expected to be working not less than 25 years. Many problems arise when implementing high temperature accelerated testing in this kind of solar cells, because the high light irradiation level, at which they work, is very difficult to achieve inside a climatic chamber. This paper presents a novel accelerated testing method for concentrator solar cells, under simulated electrical working conditions (i.e. forward biasing the solar cells at the equivalent current they would handle at 700 suns), that overcomes some of the limitations found in test these devices inside the chamber. The tracked power of the solar cells to 700x, experiences a degradation of 1.69% after 4232 h, in the 130 degrees C test, and of 2.20% after 2000 h in the 150 degrees C one. An additional test has been carried out at 150 degrees C, increasing the current to that equivalent to 1050 suns. This last test shows a power degradation of 4% for the same time.
Internacional
Si
JCR del ISI
Si
Título de la revista
MICROELECTRONICS RELIABILITY
ISSN
0026-2714
Factor de impacto JCR
1,117
Información de impacto
Volumen
50
DOI
Número de revista
Desde la página
1880
Hasta la página
1883
Mes
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Participantes
Grupos de investigación, Departamentos, Centros e Institutos de I+D+i relacionados
  • Creador: Grupo de Investigación: Semiconductores III-V
  • Centro o Instituto I+D+i: Instituto de Energía Solar