Memorias de investigación
Research Publications in journals:
Self-validating technique for the measurement of the linewidth enhancement factor in semiconductor lasers
Year:2012
Research Areas
  • Engineering,
  • Electronic technology and of the communications
Information
Abstract
A new method for measuring the linewidth enhancement factor (?-parameter) of semiconductor lasers is proposed and discussed. The method itself provides an estimation of the measurement error, thus self-validating the entire procedure. The ?-parameter is obtained from the temporal profile and the instantaneous frequency (chirp) of the pulses generated by gain switching. The time resolved chirp is measured with a polarization based optical differentiator. The accuracy of the obtained values of the ?-parameter is estimated from the comparison between the directly measured pulse spectrum and the spectrum reconstructed from the chirp and the temporal profile of the pulse. The method is applied to a VCSEL and to a DFB laser emitting around 1550 nm at different temperatures, obtaining a measurement error lower than ± 8%.
International
Si
JCR
Si
Title
Optics Express
ISBN
1094-4087
Impact factor JCR
3,749
Impact info
Datos JCR del año 2010
Volume
Journal number
From page
4979
To page
4987
Month
SIN MES
Ranking
Participants
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: Grupo de Fotónica Aplicada
  • Centro o Instituto I+D+i: Centro de Materiales y Dispositivos Avanzados para Tecnologías de Información y Comunicaciones
  • Departamento: Tecnología Fotónica y Bioingeniería
  • Departamento: Física e Instalaciones Aplicadas a la Edificación, al Medio Ambiente y al Urbanismo