Descripción
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A high resolution focused beam line has been recently installed on the AIFIRA (?Applications Interdisciplinaires des Faisceaux d?Ions en Région Aquitaine?) facility at CENBG. This nanobeam line, based on a doublet?triplet configuration of Oxford Microbeam Ltd. OM-50? quadrupoles, offers the opportunity to focus protons, deuterons and alpha particles in the MeV energy range to a sub-micrometer beam spot. The beam optics design has been studied in detail and optimized using detailed ray-tracing simulations and the full mechanical design of the beam line was reported in the Debrecen ICNMTA conference in 2008. During the last two years, the lenses have been carefully aligned and the target chamber has been fully equipped with particle and X-ray detectors, microscopes and precise positioning stages. The beam line is now operational and has been used for its first applications to ion beam analysis. Interestingly, this set-up turned out to be a very versatile tool for a wide range of applications. Indeed, even if it was not intended during the design phase, the ion optics configuration offers the opportunity to work either with a high current microbeam (using the triplet only) or with a lower current beam presenting a sub-micrometer resolution (using the doublet?triplet configuration) | |
Internacional
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Si |
JCR del ISI
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Si |
Título de la revista
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Nuclear Instruments and Methods in Physics Research B |
ISSN
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0167-5087 |
Factor de impacto JCR
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Información de impacto
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Volumen
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269 |
DOI
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Número de revista
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Desde la página
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2163 |
Hasta la página
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2167 |
Mes
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SIN MES |
Ranking
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