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Abstract
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| New measuring systems provide abundant spatial information and offer significant advantages in many applications in the field of aerospace, automotive, reverse engineering, deformations control, etc. The use of some or other systems will depend on requirements that work or project demands, but in all cases, the measurement systems must regularly have a metrological checking in order to estimate measurement uncertainty and assured its traceability. | |
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International
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Si |
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JCR
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No |
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Title
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American Institute of Physics |
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ISBN
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1551-7616 |
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Impact factor JCR
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Impact info
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Volume
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1431 |
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Journal number
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From page
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267 |
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To page
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274 |
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Month
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SIN MES |
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Ranking
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