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Descripción
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| The structure of amorphous and crystalline SiGe nanoparticles, embedded in a dielectric medium, SiO2, and its stability under ¿in situ¿ electron beam irradiation is reported. High-resolution transmission electron microscopy and electron-diffraction pattern simulation by fast Fourier transform was used to analyze the crystal structure of the SiGe nanoparticles. Electron beam irradiation induces structural alternate order-disorder transitions in the nanoparticles. Irradiation effects are mainly associated to the electron beam flux. For irradiation flux <7 A¿cm-2 no effects are observed in the as-deposited amorphous samples, whereas in the crystallized samples, SiGe nanocrystals shows higher stability and no effects are observed for irradiation flux <50 A¿cm-2. Irradiation fluxes greater than these thresholds cause consecutive amorphous-crystalline or crystalline-amorphous structure transitions respectively for both amorphous and crystallized nanoparticles. A hexagonal structure is proposed for those nanocrystals obtained after irradiation in the as deposited amorphous samples. | |
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Internacional
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Si |
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Nombre congreso
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Instute of Physics. Electron Microscopy and Analysis Groùp Conference 2007 |
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Tipo de participación
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960 |
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Lugar del congreso
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Glasgow, Reino Unido |
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Revisores
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Si |
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ISBN o ISSN
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DOI
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Fecha inicio congreso
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03/09/2007 |
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Fecha fin congreso
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07/09/2007 |
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