Memorias de investigación
Communications at congresses:
Ion-beam damage induced in SiO2: Excitonic mechanisms under heavy electronic excitation
Year:2012
Research Areas
  • Engineering
Information
Abstract
The Centro de Micro-Análisis de Materiales (CMAM) in the Universidad Autónoma de Madrid is carrying out an extensive research program on the processes induced by high energy heavy mass ions (SHI) on dielectric materials and their photonic applications [1?21]. A significant part of this activity constitutes a relevant contribution to the scientific program associated to the TECHNOFUSION project. It is performed in collaboration with the Instituto de Fusion Nuclear at the UPM, the CIEMAT, the Departamento de Física de Materiales at UAM and several other national institutions (INTA) and international laboratories (GANIL, France), Legnaro Italy, Grenoble?. The program has led to a large number of publications in reputed international journals.
International
Si
Congress
Second Workshop on Fusion Technologies and the Contribution of TECHNOFUSIÓN 2012
960
Place
Madrid
Reviewers
Si
ISBN/ISSN
978-84-695-6616-9
Start Date
18/07/2012
End Date
19/07/2012
From page
1
To page
11
2nd Workshop on Fusion Technologies and the Contribution of TECHNOFUSIÓN
Participants
  • Autor: F. Agulló-López Centro de Microanálisis de Materiales
  • Autor: J. Olivares Centro de Microanálisis de Materiales
  • Autor: Antonio Juan Rivera de Mena UPM
  • Autor: Ovidio Yordanis Peña Rodriguez UPM
  • Autor: J. Manzano-Santamaría Centro de Microanálisis de Materiales
  • Autor: M. Crespillo Centro de Microanálisis de Materiales
Research Group, Departaments and Institutes related
  • Creador: Grupo de Investigación: Fusión Nuclear Inercial y Tecnología de fusión
  • Departamento: Ingeniería Nuclear
  • Centro o Instituto I+D+i: Instituto de Fusión Nuclear