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Descripción
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| The application of methodologies for building ontologies can improve ontology quality. However, such quality is not guaranteed because of the difficulties involved in ontology modelling. These difficulties are related to the inclusion of anomalies or bad practices within the ontology development. Sev-eral authors have provided lists of typical anomalies detected in ontologies dur-ing the last decade. In this context, our aim in this paper is to describe OOPS! (OntOlogy Pitfall Scanner!), a tool for detecting pitfalls in ontologies. | |
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Internacional
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Si |
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Nombre congreso
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Demos and Poster Session at 9th Extended Semantic Web Conference (ESWC2012) |
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Tipo de participación
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960 |
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Lugar del congreso
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Heraklion, Grecia |
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Revisores
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Si |
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ISBN o ISSN
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978-3-642-30284-8 |
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DOI
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Fecha inicio congreso
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29/05/2012 |
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Fecha fin congreso
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29/05/2012 |
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Desde la página
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0 |
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Hasta la página
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0 |
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Título de las actas
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The Semantic Web: Research and Applications - 9th Extended Semantic Web Conference, ESWC 2012. Volume : 7295 |