Abstract
|
|
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Relacionado con líneas de investigación del GDS del ISOM http://www.isom.upm.es/dsemiconductores.php | |
International
|
Si |
Congress
|
27th International Conference on Defects in Semiconductor |
|
960 |
Place
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Bologna (Italy), 2013 |
Reviewers
|
Si |
ISBN/ISSN
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0000000000000 |
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|
Start Date
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21/07/2013 |
End Date
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26/07/2013 |
From page
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0 |
To page
|
3 |
|
Proceedings |