Descripción
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This paper presents different test alternatives which can be used on-site in a PV installation to detect potential induced degradation (PID) in modules. The testing procedures proposed are: thermal imaging; electroluminescence imaging; open circuit voltage measurements; operating voltage measurements; IV curve measurements; and dark IV curve measurements. Advantages and disadvantages of each test are reported. | |
Internacional
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Si |
Nombre congreso
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28th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) de París |
Tipo de participación
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960 |
Lugar del congreso
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París (Francia) |
Revisores
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Si |
ISBN o ISSN
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2196-100X |
DOI
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Fecha inicio congreso
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30/09/2013 |
Fecha fin congreso
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04/10/2013 |
Desde la página
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1 |
Hasta la página
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5 |
Título de las actas
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Proceedings 28th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) de París |