Memorias de investigación
Communications at congresses:
Case study in failure analysis of ALT on commercial triple junction concentrator solar cells
Year:2013
Research Areas
  • Electronic technology and of the communications
Information
Abstract
In this work the failure analysis carried out in III-V concentrator multijunction solar cells after a temperature accelerated life test is presented. All the failures appeared have been catastrophic since all the solar cells turned into low shunt resistances. A case study in failure analysis based on characterization by optical microscope, SEM, EDX, EQE and XPS is presented in this paper, revealing metal deterioration in the bus bar and fingers as well as cracks in the semiconductor structure beneath or next to the bus bar. In fact, in regions far from the bus bar the semiconductor structure seems not to be damaged. SEM images have dismissed the presence of metal spikes inside the solar cell structure. Therefore, we think that for these particular solar cells, failures appear mainly as a consequence of a deficient electrolytic growth of the front metallization which also results in failures in the semiconductor structure close to the bus bars.
International
Si
Congress
39th IEEE Photovoltaic Specialists Conference (PVSC)
960
Place
Tampa, Florida
Reviewers
Si
ISBN/ISSN
9781479933006
10.1109/PVSC.2013.6744465
Start Date
16/06/2013
End Date
21/06/2013
From page
1666
To page
1671
Case study in failure analysis of ALT on commercial triple junction concentrator solar cells
Participants
Research Group, Departaments and Institutes related
  • Creador: Centro o Instituto I+D+i: Instituto de Energía Solar
  • Departamento: Electrónica Física