Descripción
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Nowadays integrated circuit reliability is challenged by both variability and working conditions. Environmental radiation has become a major issue when ensuring the circuit correct behavior. The required radiation and later analysis performed to the circuit boards is both fund and time expensive. The lack of tools which support pre-manufacturing radiation hardness analysis hinders circuit designers tasks. This paper describes an extensively customizable simulation tool for the characterization of radiation effects on electronic systems. The proposed tool can produce an in depth analysis of a complete circuit in almost any kind of radiation environment in affordable computation times. | |
Internacional
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Si |
Nombre congreso
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CMOS Variability (VARI), 2014 5th European Workshop on |
Tipo de participación
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960 |
Lugar del congreso
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Palma de Mallorca |
Revisores
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Si |
ISBN o ISSN
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978-1-4799-5399-8 |
DOI
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10.1109/VARI.2014.6957082 |
Fecha inicio congreso
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29/09/2014 |
Fecha fin congreso
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01/10/2014 |
Desde la página
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1 |
Hasta la página
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6 |
Título de las actas
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CMOS Variability (VARI), 2014 5th European Workshop on |