Observatorio de I+D+i UPM

Descripción
Nowadays integrated circuit reliability is challenged by both variability and working conditions. Environmental radiation has become a major issue when ensuring the circuit correct behavior. The required radiation and later analysis performed to the circuit boards is both fund and time expensive. The lack of tools which support pre-manufacturing radiation hardness analysis hinders circuit designers tasks. This paper describes an extensively customizable simulation tool for the characterization of radiation effects on electronic systems. The proposed tool can produce an in depth analysis of a complete circuit in almost any kind of radiation environment in affordable computation times.
Internacional	Si
Nombre congreso	CMOS Variability (VARI), 2014 5th European Workshop on
Tipo de participación	960
Lugar del congreso	Palma de Mallorca
Revisores	Si
ISBN o ISSN	978-1-4799-5399-8
DOI	10.1109/VARI.2014.6957082
Fecha inicio congreso	29/09/2014
Fecha fin congreso	01/10/2014
Desde la página	1
Hasta la página	6
Título de las actas	CMOS Variability (VARI), 2014 5th European Workshop on

Esta actividad pertenece a memorias de investigación

• Autor: Fernando Garcia Redondo (UPM)
• Autor: M. Luisa Lopez Vallejo (UPM)
• Autor: Pablo Royer Del Barrio (UPM)
• Autor: Javier Agustin Saenz (UPM)

• Creador: Grupo de Investigación: Laboratorio de Sistemas Integrados (LSI)
• Departamento: Ingeniería Electrónica