Memorias de investigación
Communications at congresses:
Evolution of Radiation-Induced Soft Errors in FinFET SRAMs under Process Variations beyond 22nm
Year:2015

Research Areas
  • Verification of digital integrate circuits

Information
Abstract
International
Si
Congress
NANOARCH 2015
970
Place
Reviewers
Si
ISBN/ISSN
Start Date
End Date
From page
To page
Participants

Research Group, Departaments and Institutes related
  • Creador: Departamento: Ingeniería Electrónica