Memorias de investigación
Artículos en revistas:
STARK WIDTHS AND SHIFTS FOR SPECTRAL LINES OF Sn IV
Año:2016

Áreas de investigación
  • Fisica ac astrofisica -- cosmologia,
  • Fisica am -- fisica atomica y molecular

Datos
Descripción
In this paper, we present theoretical Stark widths and shifts calculated corresponding to 66 spectral lines of Sn?iv. We use the Griem semi-empirical approach and the cowan computer code. For the intermediate coupling calculations, the standard method of least-squares fitting from experimental energy levels was used. Data are presented for an electron density of 1017 cm?3 and temperatures T = 1.1?5.0 (104 K). The matrix elements used in these calculations have been determined from 34 configurations of Sn?iv: 4d10ns(n = 5?10), 4d10nd(n = 5?8), 4d95s2, 4d95p2, 4d95s5d, 4d85s5p2 and 4d105g for even parity and 4d10np(n = 5?8), 4d10nf (n = 4?6), 4d95snp(n = 5?8), 4d85s25p and 4d95snf (n = 4?10) for odd parity. Also, in order to test the matrix elements used in our calculations, we present calculated values of radiative lifetimes of 14 levels of Sn?iv. There is good agreement between our calculations and the experimental radiative lifetimes obtained from the bibliography. The spectral lines of Sn?iv are observed in UV spectra of HD 149499 B obtained with the Far Ultraviolet Spectroscopic Explorer, the Goddard High Resolution Spectrograph and the International Ultraviolet Explorer. Theoretical trends of the Stark broadening parameter versus the temperature for relevant lines are presented. Also our values of Stark broadening parameters have been compared with the data available in the bibliography.
Internacional
Si
JCR del ISI
Si
Título de la revista
Monthly Notices of the Royal Astronomical Society
ISSN
0035-8711
Factor de impacto JCR
5,521
Información de impacto
Datos JCR del año 2012
Volumen
DOI
10.1093/mnras/stv2170
Número de revista
455
Desde la página
1145
Hasta la página
1155
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Grupos de investigación, Departamentos, Centros e Institutos de I+D+i relacionados
  • Creador: Departamento: Ingeniería Eléctrica, Electrónica Automática y Física Aplicada