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Descripción
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| Experimental evidence of synthetic single-crystal diamond amorphization under the effect of irradiation with swift heavy ions is shown. The type of sharp thresholding behavior that characterizes electronic damage is not observed within a range of electronic stopping power covering up to 14 keV/nm. Amorphization is assessed by Rutherford Back Scattering Channeling (RBS-c) measurements done with light ions, after swift heavy ion irradiation. Results are analyzed and discussed in order to confirm the hypothesis of a nuclear damage-induced process, whereby it is concluded that electronic effects are not relevant in the studied range of stopping powers. The evolution of the amorphized fraction as a function of the irradiated fluence and nuclear stopping power is measured and discussed as well | |
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Internacional
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Si |
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JCR del ISI
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Si |
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Título de la revista
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DIAMOND & RELATED MATERIALS |
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ISSN
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0925-9635 |
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Factor de impacto JCR
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Información de impacto
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Volumen
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58 |
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DOI
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Número de revista
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Desde la página
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226 |
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Hasta la página
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229 |
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Mes
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SIN MES |
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Ranking
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