Descripción
|
|
---|---|
In the recent developments in the field of III-V on Si dual-junction solar cells, low attention has been paid to optimizing the device configuration to maximize its photovoltaic performance. The few practical implementations reported heretofore have been based on III-V solar cell processing techniques. Although the fabrication of conventional Si structures is a well-known technology, certain steps have been found to be incompatible with III-V semiconductors, primarily due to their high thermal load. Accordingly, in this work we discuss the applicability of different alternatives for the Si rear-surface passivation (Al-BSF, PERC- and HIT-like schemes) in III-V/Si dual-junction solar cell structures. Using numerical simulations, a comparison of the Si bottom cell performance in a GaAsP/Si dual-junction solar cell structure is presented for the mentioned alternatives. | |
Internacional
|
Si |
Nombre congreso
|
42nd IEEE Photovoltaic Specialist Conference, |
Tipo de participación
|
960 |
Lugar del congreso
|
New Orleans; EEUU |
Revisores
|
Si |
ISBN o ISSN
|
978-1-4799-7944-8 |
DOI
|
10.1109/pvsc.2015.7356235 |
Fecha inicio congreso
|
14/06/2015 |
Fecha fin congreso
|
19/06/2015 |
Desde la página
|
1 |
Hasta la página
|
4 |
Título de las actas
|
Proc. PVSC 2015 |