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Descripción
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| Process, voltage and temperature (PVT) variations seriously affect the performance of nanometer scale circuits. In this talk we present how current electronic circuits can dynamically adapt to this varying environment based on the use of small embedded monitoring cirtuits. | |
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Internacional
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Si |
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Nombre congreso
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Ultra low power circuits seminar series |
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Entidad organizadora
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MIT |
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Nacionalidad Entidad
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E.E.U.U. DE AMERICA |
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Lugar/Ciudad de impartición
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Cambridge, Massachusetts, EEUU |
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Fecha inicio
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02/10/2015 |
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Fecha fin
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02/10/2015 |