Communications at congresses:
2-D and 3-D TCAD simulations of defect-tolerant solar cell architectures
Year:2015
Research Areas
- Solar cells
Information
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Abstract
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| We use 2-D and 3-D TCAD simulations in Sentaurus Device to determine the injection-dependent device performance impacts of point defects (e.g., Fei) and extended defects (e.g., grain boundaries). We identify features of device design that contribute to defect tolerance. | |
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International
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Si |
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Congress
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25th Workshop on Crystalline Silicon Solar Cells Materials and Processes |
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970 |
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Place
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Keystone (CO) EEUU |
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Reviewers
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Si |
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ISBN/ISSN
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0000-0000 |
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Start Date
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26/07/2015 |
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End Date
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29/07/2015 |
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From page
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0 |
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To page
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0 |
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25th Workshop on Crystalline Silicon Solar Cells Materials and Processes |
Open Access publication
Participants
- Autor: D.B. Needleman
- Autor: H. Wagner
- Autor: P.P. Altermatt
- Autor: Carlos del Cañizo Nadal UPM
- Autor: T. Buonassisi
Research Group, Departaments and Institutes related
- Creador: Centro o Instituto I+D+i: Instituto de Energía Solar
- Departamento: Electrónica Física