Descripción
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We use 2-D and 3-D TCAD simulations in Sentaurus Device to determine the injection-dependent device performance impacts of point defects (e.g., Fei) and extended defects (e.g., grain boundaries). We identify features of device design that contribute to defect tolerance. | |
Internacional
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Si |
Nombre congreso
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25th Workshop on Crystalline Silicon Solar Cells Materials and Processes |
Tipo de participación
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970 |
Lugar del congreso
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Keystone (CO) EEUU |
Revisores
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Si |
ISBN o ISSN
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0000-0000 |
DOI
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Fecha inicio congreso
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26/07/2015 |
Fecha fin congreso
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29/07/2015 |
Desde la página
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0 |
Hasta la página
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0 |
Título de las actas
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25th Workshop on Crystalline Silicon Solar Cells Materials and Processes |