Memorias de investigación
Research Publications in journals:
Evolution of Radiation-Induced Soft Errors in FinFET SRAMs under Process Variations beyond 22nm
Year:2015

Research Areas

Information
Abstract
0
International
Si
JCR
Si
Title
PROCEEDINGS OF THE 2015 IEEE/ACM INTERNATIONAL SYMPOSIUM ON NANOSCALE ARCHITECTURES (NANOARCH 15)
ISBN
2327-8218
Impact factor JCR
0
Impact info
Volume
Journal number
From page
112
To page
117
Month
Ranking
0
Participants

Research Group, Departaments and Institutes related
  • Creador: No seleccionado
  • Departamento: Ingeniería Electrónica