Observatorio de I+D+i UPM

Descripción
The effects caused by variability, temperature, radiation or aging may compromise the reliability of electronic circuits. Circuits designers must consider their combined effects early during the design cycle, even though it is a time and effort demanding task. In this work we present a methodology and simulation framework for the reliable design of circuits working under realistic conditions such as a wide range of temperatures, radiation and process variations. This proposal provides an alternative method for validating digital and analog circuits. Depending on the analyzed circuit functionality, the user is able to define complex reliability metrics such as signal upsets, delays or frequency deviations to measure the circuit response in affordable simulation time.
Internacional	Si
Nombre congreso	Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2016 13th International Conference on
Tipo de participación	960
Lugar del congreso	Lisboa
Revisores	Si
ISBN o ISSN	978-1-5090-0490-4
DOI	10.1109/SMACD.2016.7520646
Fecha inicio congreso	27/06/2016
Fecha fin congreso	30/06/2016
Desde la página	0
Hasta la página	1
Título de las actas	Reliable design methodology: The combined effect of radiation, variability and temperature

Esta actividad pertenece a memorias de investigación

• Autor: Fernando Garcia Redondo (UPM)
• Autor: M. Luisa Lopez Vallejo (UPM)
• Autor: Hernan Aparicio Cerqueira (UPM)
• Autor: Pablo Ituero Herrero (UPM)

• Creador: Grupo de Investigación: Laboratorio de Sistemas Integrados (LSI)
• Centro o Instituto I+D+i: Centro de I+d+i en Procesado de la Información y Telecomunicaciones
• Departamento: Ingeniería Electrónica