Abstract
|
|
---|---|
0 | |
International
|
Si |
JCR
|
Si |
Title
|
MICROELECTRONICS RELIABILITY |
ISBN
|
0026-2714 |
Impact factor JCR
|
1,433 |
Impact info
|
|
Volume
|
64 |
|
10.1016/j.microrel.2016.07.021 |
Journal number
|
|
From page
|
631 |
To page
|
634 |
Month
|
|
Ranking
|
0 |