Research Publications in journals:
Accelerated Life Test of high luminosity blue LEDs
Year:2016
Research Areas
Information
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Abstract
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| 0 | |
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International
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Si |
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JCR
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Si |
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Title
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MICROELECTRONICS RELIABILITY |
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ISBN
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0026-2714 |
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Impact factor JCR
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1,433 |
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Impact info
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Volume
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64 |
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10.1016/j.microrel.2016.07.021 |
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Journal number
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From page
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631 |
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To page
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634 |
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Month
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Ranking
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0 |
Open Access publication
Participants
- Autor: e. nogueira UPM
- Autor: v. orlando UPM
- Autor: j. ochoa UPM
- Autor: Antonio Fernandez Fernandez UPM
- Autor: Beatriz Fernandez Agueda UPM
- Autor: Ana Serrano Fernandez UPM
- Autor: Maria Covadonga Fernandez Baizan UPM
- Autor: M. Aurora Fernandez Rodriguez UPM
- Autor: Antonio Alvarez Fernandez Balbuena UPM
- Autor: Raquel Fernandez Espartosa UPM
- Autor: m. vazquez UPM
Research Group, Departaments and Institutes related
- Grupo de Investigación: Semiconductores III-V
- Grupo de Investigación: Análisis y Documentación de Arquitectura, Diseño, Moda & Sociedad
- Departamento: Electrónica Física
- Departamento: Ingeniería y Gestión Forestal y Ambiental
- Departamento: Lenguajes y Sistemas Informáticos e Ingeniería de Software