Memorias de investigación
Research Publications in journals:
Differences between GaAs/GaInP and GaAs/AlInP interfaces grown by movpe revealed by depth profiling and angle-resolved X-ray photoelectron spectroscopies
Year:2016
Research Areas
Information
Abstract
0
International
Si
JCR
Si
Title
APPLIED SURFACE SCIENCE
ISBN
0169-4332
Impact factor JCR
2,711
Impact info
Volume
360
10.1016/j.apsusc.2015.10.098
Journal number
From page
477
To page
484
Month
Ranking
0
Participants
  • Autor: i. garcia UPM
  • Autor: m. c. lopez-escalante
  • Autor: e. barrigon UPM
  • Autor: m. gabas
  • Autor: i. rey-stolle UPM
  • Autor: c. algora UPM
  • Autor: s. palanco
  • Autor: j. r. ramos-barrado
Research Group, Departaments and Institutes related
  • Creador: No seleccionado
  • Grupo de Investigación: Semiconductores III-V
  • Departamento: Electrónica Física